Our Facilities
Lakeshore CRX-VF cryogen-free probe station with magnets
This cryogen-free probe station is used for temperature-controlled measurements and provides high-performance testing for semiconductor materials.
Cascade semi-automatic probe station
This semi-automatic probe station is designed for precise probing and testing of electrical characteristics of semiconductor devices.
Signatone high power probe station
Our high power probe station is ideal for testing high-voltage devices, ensuring reliability and precision during device evaluation.
Keysight B1500A Semiconductor Device Analyzer
This device analyzer provides comprehensive measurement capabilities for evaluating semiconductor devices’ characteristics with high accuracy.
Keysight B1505A Power Device Analyzer with on-wafer gate charge measurement system
The B1505A analyzer is a critical tool for testing power devices, offering on-wafer measurements for gate charge and other critical parameters.
Graphene Square TCVD-DRF100CA MOCVD system for two-dimensional materials
This MOCVD system is designed for the deposition of 2D materials like graphene, enabling advanced research in materials science and nanotechnology.
