Senior Research Scientist, Air Force Research Labs

Kurt Eyink’s research focusses on the use of molecular beam epitaxy in the growth and development of electronic and optical materials for future AF applications.

Dr. Eyink receive his B.S. in Material Science and Engineering from Wright State University in 1983 and his M.S. in M.S.E from the University of Dayton in 1986 and his PhD from the University of Texas at Austin in 1996.  He started his career at the Wright-Patterson AFB in the Materials and Manufacturing Directorate in 1981. Dr. Eyink initial research focused on in-situ real-time control of the MBE growth process. But has worked on the development of electronic materials for high electron mobility detectors, IR detectors, He is currently research involves increasing the emission rate of single photon emitters through coupling with hyperbolics, metamaterials, and plasmonics.  He is a utilizing strained layer superlattices for the development of topological insulators for spin polarization detection.  He has chaired numerous conference session as well as help organize conference such EMC, NAMBE, Quantum Dots Nanoparticles and Nanocluster, and IEEE Rapid. He is an associate editor for Journal of Electronic Materials. He has reviewed programs for many government agencies such as NSF, ARO, DARPA, AFOSR, AFMC.